逆变模块双脉冲测试

Double-pulsetestprincipleIGBTMeasurementsTurn-on&Turn-offTestSetupPage2Copyright©InfineonTechnologies2008.Allrightsreserved.Forinternaluseonly2013/5/22IGBTMeasurementsTurn-on&Turn-offBasicWaveformsPage3Copyright©InfineonTechnologies2008.Allrightsreserved.Forinternaluseonly2013/5/22IGBTMeasurementsTurn-on&Turn-offSampleWaveformsPage4Copyright©InfineonTechnologies2008.Allrightsreserved.Forinternaluseonly2013/5/22IGBTMeasurementsShortCircuitI&IITestSetupPage5Copyright©InfineonTechnologies2008.Allrightsreserved.Forinternaluseonly2013/5/22TwoTypesofShort-circuitsBeforeshort-circuitoccurs,IGBTisOFF&blockstheDC-busvoltage.Theshort-circuitiscreatedbytheswitch-onoftheIGBT.Beforetheshort-circuitoccurs,IGBTisON&insaturationregion.Theshort-circuitiscreatedbyapplyingtheDC-busvoltageonC-EoftheIGBT.Page6Copyright©InfineonTechnologies2008.Allrightsreserved.Forinternaluseonly2013/5/22VCEneverreachesVCEsatvalue!VCEde-saturatesfromVCEsatvalue!DiodeMeasurementsTestSetupPage7Copyright©InfineonTechnologies2008.Allrightsreserved.Forinternaluseonly2013/5/22DiodeMeasurementsRecoveryBasicWaveformsPage8Copyright©InfineonTechnologies2008.Allrightsreserved.Forinternaluseonly2013/5/22DiodeMeasurementsRecoverySampleWaveformdiF/dtErecQr50%IF-50%IRM10%VR-2%IRMIF=0-2%IRMPage9Copyright©InfineonTechnologies2008.Allrightsreserved.Forinternaluseonly2013/5/22Erec:10%VR